Please use this identifier to cite or link to this item:
https://hdl.handle.net/10955/5449
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cosentino, Giuseppe | - |
dc.contributor.author | Crupi, Felice | - |
dc.date.accessioned | 2024-03-07T12:27:14Z | - |
dc.date.available | 2024-03-07T12:27:14Z | - |
dc.date.issued | 2021-05-05 | - |
dc.identifier.uri | https://hdl.handle.net/10955/5449 | - |
dc.description | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica Dottorato di Ricerca in ICT. Ciclo XXXIII | en_US |
dc.language.iso | en | en_US |
dc.publisher | Università della Calabria | en_US |
dc.relation.ispartofseries | ING-INF/01; | - |
dc.subject | SiC Power MOSFETs | en_US |
dc.subject | Defectiveness | en_US |
dc.subject | Threshold-Voltage Instability | en_US |
dc.subject | PBTI, flicker noise | en_US |
dc.subject | Research Subject Categories::TECHNOLOGY::Information technology::Computer engineering | en_US |
dc.title | Study characterization of modern 4h-sic power mosfetsF | en_US |
dc.type | Thesis | en_US |
Appears in Collections: | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica - Tesi di Dottorato |
Files in This Item:
File | Description | Size | Format | |
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tesi Consentino_Redacted.pdf | 19,54 MB | Adobe PDF | View/Open |
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