Contro system for the improvement of CMOS-Technology for X-RAY contrast phase imaging
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Brito Del Pino, Jose Francesco
Carbone, Vincenzo
Agostino, Raffaele
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Dottorato di Ricerca in Scienze e Tecnologie Fisiche, Chimiche e dei Materiali. Ciclo XXIX; The present dissertation is intended describing the results of the research project
developed at the μTomo Laboratory of the STAR light source, as part of the PON MaTeRiA
Project at the University of Calabria.
The project involved making the data acquisition and treatment tools by developing a
complete software package in LabView language for remote control of the μTomo
microtomography system. The programming consisted of control of the whole
experimental station including five stepper motors and a flat panel detector necessary for
the sample alignment and image acquisition. The first tomographic investigation
performed by the μTomo beamline are reported and discussed.
Furthermore, the software was evolved to be integrated into the STAR control system i.e.
to run as an EPICS server in LabView language and permit the remote control on a EPICS
platform at the same control level as the STAR source As part of the research project, in the framework of a scientific collaboration with the ID17
beamline dedicated to biomedical imaging, radiation biology and radiation therapy, of the
ESRF Synchrotron in Grenoble (F), a Graphic User Interface was developed for the
implementation of the Propagation-based phase-contrast imaging technique, the
software was tested by carrying out two micro-CT experiments.
For the sake of a clear description this dissertation was divided into four parts:
Chapter I: Theoretical foundation, description of fundamentals on X-ray
microtomography.
Chapter II: Hardware Implementation, detailed description of acquisition system.
Chapter III: Development and testing of Data Acquisition Software
Chapter IV: Results and Discussion on benchmark experiments carried out to verify the
micro-tomography systems performance; Università della Calabria.Soggetto
Metal oxide semiconductors, Complementary
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