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https://hdl.handle.net/10955/5557
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DC Field | Value | Language |
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dc.contributor.author | Settino, Francesco | - |
dc.contributor.author | Crupi, Felice | - |
dc.contributor.author | Palestri, Pierpaolo | - |
dc.contributor.author | Brandtner, Thomas | - |
dc.contributor.author | Koffler, Harald | - |
dc.date.accessioned | 2025-02-28T12:15:00Z | - |
dc.date.available | 2025-02-28T12:15:00Z | - |
dc.date.issued | 2020-04-30 | - |
dc.identifier.uri | https://hdl.handle.net/10955/5557 | - |
dc.description | Università della Calabria. Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica. Dottorato di ricerca in Information and Communication Technologies (ICT) | en_US |
dc.description.abstract | The development of new generation System-on-Chip (SoC) is mainly driven by the demand of an ever increasing number of functionalities at reduced cost and time-to-market. This is enabled by re-using specialized functional blocks, generally referred as intellectual property (IP) blocks. However, each block (analog, digital, analog mixed-signal) is typically designed and optimized independently either inhouse or by a third-party vendor. This leads to an increased design complexity, making the integration of the analog mixed-signal (AMS) blocks very challenging. As the switching behavior (di/dt and dv/dt) of the chip signals increases due to higher clock frequency, the package and board interconnects start to contribute significantly to the overall system-level performance. Signal integrity is a main issue in package designs due to the parasitic effects of capacitive/inductive coupling between potential aggressor and victim signals. In general, fast switching signals can induce unwanted disturbances into sensitive signals due to crosstalk effects even via off-chip interconnects, which may degrade significantly the overall system-level performance. A SoC for automotive applications typically requires several high accuracy analog-to-digital converters (ADCs), which are key blocks to sense and process the external inputs in order to quickly react at system-level (especially for safety requirements). However, those ADCs need to be integrated in a complex environment that comprises many different IP blocks (e.g. power converter or high-speed interfaces) at high switching frequency that can act as potential aggressors. Hence, next generation of SoC will face a significantly higher number of aggressor-victim couples. On the other hand, more accurate mixed-signal circuitries such as voltage monitoring will be required especially for advanced driver assistance systems (ADAS) application due to safety requirements. Reliable and accurate prediction of the system-level behavior by chip-packageboard co-design is essential to achieve “right first time” solutions. A machine learning approach can save significant time considering the main challenges in performing system-level simulations, mainly related to circuit complexity and convergence issue due to the integration of the package model (typically S-parameter data). This research work focuses on the development of a methodology exploiting machine learning algorithm to enable optimized SoC-Package co-design right from the early stage of the development cycle. The main target is to detect potential specification violation issues at system-level that may occur due to signal integrity challenge at package-level, providing guidelines for package design, and a quick feedback for the chip design development towards the optimization of the overall chip-package-board system, optimizing development cycles and time-to-market for competitive products. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Università della Calabria | en_US |
dc.relation.ispartofseries | ING-INF/01; | - |
dc.subject | CHIP-PACKAGE CO-DESIGN | en_US |
dc.subject | COCO-SIMULATION METHODOLOGY | en_US |
dc.subject | SIGNAL INTEGRITY | en_US |
dc.subject | EM SIMULATION | en_US |
dc.subject | MACHINE LEARNING | en_US |
dc.title | An Analog/Mixed-Signal SoC-Package Co-Design Methodology for Early Stage Signal Integrity Assessment Exploiting the Potential of Machine Learning Models | en_US |
dc.type | Thesis | en_US |
Appears in Collections: | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica - Tesi di Dottorato |
Files in This Item:
File | Description | Size | Format | |
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PhD_Thesis_final (Francesco Settino) (1)_Redacted.pdf | 40,51 MB | Adobe PDF | View/Open |
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