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https://hdl.handle.net/10955/617| Title: | Reflection spectroscopic ellipsometry investigations of reciprocal interactions between organic-inorganic layered structures |
| Authors: | D'Elia, Stefano Versace, Carlo |
| Keywords: | Fisica Spettrometria Film sottili |
| Issue Date: | 2008 |
| Series/Report no.: | FIS/01; |
| Description: | Dottorato di Ricerca in Science and Technology of Mesophases and Molecular Materials Ciclo XXI SSD, a.a. 2007-2008 |
| URI: | http://hdl.handle.net/10955/617 |
| Appears in Collections: | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica - Tesi di Dottorato |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| D'Elia Stefano STMMM XXI Ciclo FIS-01 (November 2008) High Quality version.pdf | 20,39 MB | Adobe PDF | View/Open |
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