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<<A>> Defect-Centric analysis of the channel hot carrier degradation
(2016-02-02)
Durante l'ultimo decennio, il channel hot carrier (CHC) e
stato considerato uno dei pi u importanti meccanismi di degrado
della moderna tecnologia CMOS. La degradazione CHC si veri-
ca quando un voltaggio superiore a ...
SiGe BicMOS Building Blocks for 5G Applications
(2019-01-18)
SiGe BiCMOS semiconductor technology has been increasing its application domain especially for the development of complex microwave monolithically integrated circuits (MMIC) required for modern telecommunication systems. ...