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https://hdl.handle.net/10955/5449| Title: | Study characterization of modern 4h-sic power mosfetsF |
| Authors: | Cosentino, Giuseppe Crupi, Felice |
| Keywords: | SiC Power MOSFETs Defectiveness Threshold-Voltage Instability PBTI, flicker noise Research Subject Categories::TECHNOLOGY::Information technology::Computer engineering |
| Issue Date: | 5-May-2021 |
| Publisher: | Università della Calabria |
| Series/Report no.: | ING-INF/01; |
| Description: | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica Dottorato di Ricerca in ICT. Ciclo XXXIII |
| URI: | https://hdl.handle.net/10955/5449 |
| Appears in Collections: | Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica - Tesi di Dottorato |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| tesi Consentino_Redacted.pdf | 19,54 MB | Adobe PDF | View/Open |
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